光學(xué)系統(tǒng)Optical system

1. 譜線Optical lines
2. 控制、電子采集和數(shù)據(jù)讀出系統(tǒng)Control, Acquisition Electronics and read out system
3. 火花源Spark Source
4. 火花臺(tái)Spark Stand
5. 軟件Software
6. 控制中心：電腦Control station : computer

組成部分的描述：

DESCRIPTION OF THE COMPONENTS:

1. 光學(xué)系統(tǒng)OPTICAL SYSTEM

v 多塊高性能CCD檢測(cè)器系統(tǒng)，根據(jù)應(yīng)用需要最多達(dá)16塊CCD檢測(cè)器

Multi High Resolution CCD Multi detectors (Charge Coupled Device) system with up to 16 CCD solid state detectors depending on the application

v 每塊CCD 3,648像素

Each CCD has 3,648 active elements (pixels equivalent)

v 58,368像素的分辨率(16 x 3,648像素)

Resolution of full range 58,368 active elements (pixels) (16 x 3,648 pixels)

v 高性能全息衍射光柵，光柵刻線1200或2700或3600條/mm

High luminosity holographic grating with 1200 or 2700 or 3600 grooves per mm

v 溫度穩(wěn)定系統(tǒng)

Stabilized against fluctuations in temperature

v 采用特殊材料應(yīng)對(duì)漂移

Special material for drift free

v 焦距：500 mm

Focal length 500 mm for all optical systems

v 譜線波長(zhǎng)：140 - 800 nm由衍射光柵的選擇決定。光柵的選擇由制造商根據(jù)分析元素和分析程序來(lái)決定

Spectral optical wavelength 140 – 800 nm depending on selected diffraction grating. Grating selection is made by manufacturer depending on analytical programs and elements

v 全光學(xué)系統(tǒng)自動(dòng)描跡

Automatic profiling full optical system

v 密閉的真空光學(xué)室可以避免灰塵、光線的干擾

Vacuum tight optical chamber sealed against light and dust

1. 譜線OPTICAL LINES

v SCP覆蓋了全元素分析范圍，可根據(jù)具體需要分析相應(yīng)的元素

SCP can be equipped with all the needed spectral lines basing on analytical programs requested

v 光學(xué)系統(tǒng)包括固態(tài)檢測(cè)器能夠測(cè)量樣品所發(fā)出的全譜

Optical system includes full range multi-chanel CCDs solid state detectors able to measure the whole optical spectra emitted by all elements in the samples

v 并且為將來(lái)可能的升級(jí)，增加分析線（元素）方便

It’s always possible to integrate new spectral lines (elements) for future upgrade

v 可現(xiàn)場(chǎng)增加分析程序

Possible on site addition of analytical programs

1. 控制、電子采集和數(shù)據(jù)讀出系統(tǒng)CONTROL, ACQUISITION ELECTRONICS and READ OUT

v 電子系統(tǒng)具有微處理器控制的多通道積分和數(shù)據(jù)系統(tǒng)采集功能

Electronic system with integrators multi-channels and Data System Acquisition PC controlled by microprocessor

v 高速16位模數(shù)轉(zhuǎn)換器

High speed 16 Bit ADC

v ISP混合信號(hào)Flash微控制器100MHz

Mixed Signal ISP Flash MCU 100 MHz

v 多種連接源

Serial Source Interface

v 高速讀出及高速USB借口支持快速數(shù)據(jù)控制與處理系統(tǒng)

High speed readout with high speed interface USB for fast data processing and controlling the system

v 最多16塊CCD模塊，由制造商根據(jù)應(yīng)用情況選擇

Up to 16 input for CCD modules. CCD modules selected by manufacturer

1. 火花源SPARK SOURCE

v 全自動(dòng)控制火花源

Full automatic controlled source

v 半導(dǎo)體控制放電激發(fā)

Solid state spark source semiconductor controlled.

v 1到100 A等離子體電流

Plasma current from 1 to 100 A

v 放電參數(shù)由密碼保護(hù)

The discharge parameters are protected by password

v 特別的分析要求可有不同的激發(fā)參數(shù)

Variable discharge parameters for individual analytical tasks

v 火花光源放電穩(wěn)定，不受供電系統(tǒng)波動(dòng)的影響

The spark source is stabilized against variations of the power supply

v 激發(fā)參數(shù)由激發(fā)線和分析程序標(biāo)定和控制

Excitation parameters configurated and controlled according to excitation lines and analytical programs

v 火花源可有多種參數(shù)設(shè)置

Spark source with variable parameters

v 火花頻率: 200到to 1000 Hz (可控)

Spark Frequency: 200 up to 1000 Hz (controllable)

v 火花持續(xù)時(shí)間10-10000 us (可控)

Spark time 10-10000 us (controllable)

1. 火花臺(tái)SPARK STAND

v 開(kāi)放式的火花臺(tái)可以分析測(cè)試重達(dá)20Kg的各種形狀的樣品

The open universal spark stand allows to analyse samples up to 20 Kg and suitable for samples in different forms

v 電極易于拆卸維護(hù)

The electrode is easily removable for maintenance

v 氬氣吹掃火花臺(tái)，低氬氣消耗

Argon flushed spark stand with minimum consumption of Argon

v 使用便捷的樣品夾支持快速樣品更換

Quick change with simple designed sample clamp for fast sample throughput

v 不同樣品的適配器可滿足各種樣品的需求（可選）

Small adapters for different samples are also available for various kind of samples(options)